SENSOFAR 出版物
出版物
Stefan Heilmann, Christoph Zwahr, Alexander Knape, Jorg Zschetzsche, Andres Fabian Lasagni, Uwe Fussel - Advanced Engineering Materials Volume 20
Maike Werner, Nicholas A. Kurniawan, Gabriela Korus, Carlijn V. C. Bouten, Ansgar Petersen - Journal of The Royal Society Interface Volume 15, Pages 20180162-20180162
Long Ye, Xiaolei Chen, Shuigen Huang, Jun Qian, Jef Vleugels, Dominiek Reynaerts - Procedia CIRP Volume 113, Pages 47-52
Samuel D. Arman, Thomas A. A. Prowse, Aidan M. C. Couzens, Peter S. Ungar, Gavin J. Prideaux - Journal of The Royal Society Interface Volume 16, Pages 20180957-20180957
Elena Cutrin Gomez, S. Anguiano-Igea, M. Begona DelgadoCharro, J.L. Gomez-Amoza, Francisco J. OteroEspinar - European Journal of Pharmaceutics and Biopharmaceutics Volume 128, Pages 48-56
F. Rey-Garcia, Carmen Bao, German F. de la Fuente, Carlos Gomez-Reino, E. Perez Trigo, Pablo Baladron Rodriguez, A. Gallas Torreira, A. Pazos, B. Adeva, A. Alonso, Xesus Prieto-Blanco - Journal of Lightwave Technology Volume 31, Pages 2327-2331
Simone Carmignato, Valentina Aloisi, Fabrizio Medeossi, Filippo Zanini, Enrico Savio - CIRP Annals Volume 66, Pages 499-502
Nikolai Schroder, G. Vergara, Bogdan Voisat, Andres Fabian Lasagni - Journal of Laser Micro/Nanoengineering Volume None
Alberto Bordin, Stano Imbrogno, Stefania Bruschi, Andrea Ghiotti, Domenico Umbrello - Key engineering materials Volume 651-653, Pages 1255-1260
Valerie Baco-Carles, Vincent Baylac, Isabelle Pasquet, Baptiste Plissonneau, Philippe Tailhades - Powder Technology Volume 399, Pages 117200-117200
Kaija Schaepe, Janina Werner, Kristina Glenske, Tessa B. Moyer, Anja Hen, Marcus Rohnke, Sabine Wenisch, Jurgen Janek - Analytical and Bioanalytical Chemistry Volume 409, Pages 4425-4435
Long Ye, Jun Qian, Han Haitjema, Dominiek Reynaerts - Precision Engineering Volume 76, Pages 110-123
M.A. Arenas, Juan Ignacio AhuirTorres, I. Garca, Hipolito Carvajal Fals, J. de Damborenea - Tribology International Volume 128, Pages 240-247
S. M. Kleinendorst, Salman Shafqat, M.G.D. Geers, J.P.M. Hoefnagels - Measurement Science and Technology Volume 32, Pages 064001-064001
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