SENSOFARユーザー論文
SENSOFARユーザー論文
EunSoo Kim, Woo June Choi - Applied Sciences Volume 11, Pages 6839-6839
F. J. Blanco, Maria Agirregabiria, J. Berganzo, Kepa Mayora, J. Garcia, A. Calle, Carlos Domnguez, Laura M. Lechuga - Journal of Micromechanics and Microengineering Volume 16, Pages 1006-1016
Kate McGrath, Sireen ElZaatari, Debbie GuatelliSteinberg, Margaret A. Stanton, Donald J. Reid, Tara S. Stoinski, Michael R. Cranfield, Antoine Mudakikwa, Shannon C. McFarlin - American Journal of Physical Anthropology Volume 166, Pages 337-352
C. Drexler, Tatiana V. Shishkanova, Christoph Lange, S. N. Danilov, D. Wei, Sergey Ganichev, Vladimir M. Mirsky - Microchimica Acta Volume 181, Pages 1857-1862
Alberto Bordin, Stano Imbrogno, Giovanna Rotella, Stefania Bruschi, Andrea Ghiotti, Domenico Umbrello - Procedia CIRP Volume 31, Pages 551-556
Ch Sateesh Kumar, Gorka Urbikain, Luis Norberto Lopez de Lacalle, S. Gangopadhyay, Filipe Fernandes - Tribology International Volume 186, Pages 108604-108604
Chao Zuo, Qian Chen, Weijuan Qu, Anand Asundi - Optics Letters Volume 38, Pages 3538-3538
Daniel Nieto, Justo Arines, Gerard M. OConnor, M. T. Flores-Arias - Applied Optics Volume 54, Pages 8596-8596
Eric F. Law, Keith B. Morris - Journal of Forensic Sciences Volume 65, Pages 1945-1953
Kamil Leksycki, E. Feldshtein, Radosaw W. Maruda, Navneet Khanna, Grzegorz Krolczyk, Catalin I. Pruncu - Tribology International Volume 170, Pages 107504-107504
Matthias Cumme, Arnaud Deparnay - Advanced Optical Technologies Volume 4, Pages 47-61
Mario Garcia-Lechuga, J. Sols, Jan Siegel - Applied Physics A Volume 124
W.E. Alphonso, Markus Baier, Simone Carmignato, Jesper Henri Hattel, Mohamad Bayat - Journal of Manufacturing Processes Volume 94, Pages 564-577
Carlos Bermudez, Ferran Laguarta, Cristina Cadevall, Aitor Matilla, Sergi Ibanez, Roger Artigas - Applied Optics Volume 56, Pages D134-D134
Fabien Lanoue, Frederic Veron, Isabelle Pasquet, Kateryna Kiryukhina, Valerie Baco-Carles, O. Vendier, Philippe Tailhades - Journal of Materials Research and Technology Volume 27, Pages 4772-4786
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