PAPERS
論文
の研究開発は、技術的な知識と計測システムの能力を発展させ続けています。このことは、当社の最新の研究成果を科学や光学計測のコミュニティに発表する継続的な取り組みが示すとおりです。その証拠は、現在入手可能な技術的な出版物の数に表れています。
技術的・科学的出版物に表される計測の専門知識
以下のリンクから、さまざまな産業分野にわたる表面形状測定技術に関するトピックをご覧いただけます。
これらは、当社が専門知識を有する光学技術における具体的な3D表面測定ソリューションとアプリケーションの範囲の広さを表しています。
Computational self-corrected quantitative 3D topographic imaging
We have developed a self-correction algorithm capable of greatly reducing non-linearity errors in the scanning mechanism of 3D microscopy. The approach is computationally self-corrected in the [...]
Fast topographic optical imaging using encoded search focal scan
We propose a method for increasing the speed of topographic imaging by orders of magnitude.
Single-shot optical surface profiling using extended depth of field 3D microscopy
We report the implementation of a technique able to reconstruct surface topographies at high resolution, only from the acquisition of a single camera shot, dropping the need to perform an axial [...]
Optical system for the measurement of the surface topography of additively manufactured parts
We present an optical system that features a large numerical aperture (>0.3) and a wide field of view (2.9 x 2.9) mm, capable of measuring additive manufacturing parts in a single measurement, [...]
Super-resolved 3D optical profiling for surface metrology using structured illumination
We modify a DMD-based optical profiler to enable lateral super-resolution of the image stack and explore how the quality of the 3D surface reconstruction can be improved.
Metrological characterization of different methods for recovering the optically sectioned image by means of structured light
We study how several methods of structured illumination microscopy affect the metrological characteristics of an areal optical profiler.
Using optical areal measurement methods to assess the surface shape and texture on aluminium anodized surfaces
We try to measure the three dimensional surface texture and shape of aluminium anodized parts with high lateral resolution.
Printing of silver conductive lines through laser-induced forward transfer
To prove the feasibility of the proposed approach for printing continuous lines free from scalloping and bulging with excellent definition.
Papers
Sensofar R&D is constantly growing its know-how, technology and system capabilities.
These developments are illustrated by Sensofar’s continued commitment within and for the scientific optical metrology community, a proof of this is the number of technological papers that have been developed and published.
Our expertise reflected in technical and scientific publications
A collection of articles dealing with very interesting topics on surface metrology within the framework of several markets and industries.
Includes a wide range of specific 3D surface measurement solutions, or applications of optical technologies in which we are experts:
Computational self-corrected quantitative 3D topographic imaging
We have developed a self-correction algorithm capable of greatly reducing non-linearity errors in the scanning mechanism of 3D microscopy. The approach is computationally self-corrected in the [...]
Fast topographic optical imaging using encoded search focal scan
We propose a method for increasing the speed of topographic imaging by orders of magnitude.
Single-shot optical surface profiling using extended depth of field 3D microscopy
We report the implementation of a technique able to reconstruct surface topographies at high resolution, only from the acquisition of a single camera shot, dropping the need to perform an axial [...]
Optical system for the measurement of the surface topography of additively manufactured parts
We present an optical system that features a large numerical aperture (>0.3) and a wide field of view (2.9 x 2.9) mm, capable of measuring additive manufacturing parts in a single measurement, [...]
