PAPERS
Sensofar Papers
Sensofar’s R&D continues to expand its technical knowledge and metrology system capabilities. This is shown by the ongoing commitment to publish our latest research to the scientific and optical metrology communities. Proof is found in the number of technological publications currently available.
Metrology expertise reflected in our technical and scientific publications
The links below lead to multiple surface metrology topics across several industries.
These represent a wide range of specific 3D surface measurement solutions and application of optical technologies in which we have expertise:
Computational self-corrected quantitative 3D topographic imaging
We have developed a self-correction algorithm capable of greatly reducing non-linearity errors in the scanning mechanism of 3D microscopy. The approach is computationally self-corrected in the [...]
Fast topographic optical imaging using encoded search focal scan
We propose a method for increasing the speed of topographic imaging by orders of magnitude.
Optimisation of imaging confocal microscopy for topography measurements of metal additive surfaces
The contribution offered by this work is an increased understanding of imaging confocal microscopy measurement of metal additive surfaces, along with the establishment of good practice guidance [...]
Single-shot optical surface profiling using extended depth of field 3D microscopy
We report the implementation of a technique able to reconstruct surface topographies at high resolution, only from the acquisition of a single camera shot, dropping the need to perform an axial [...]
Optical system for the measurement of the surface topography of additively manufactured parts
We present an optical system that features a large numerical aperture (>0.3) and a wide field of view (2.9 x 2.9) mm, capable of measuring additive manufacturing parts in a single measurement, [...]
Super-resolved 3D optical profiling for surface metrology using structured illumination
We modify a DMD-based optical profiler to enable lateral super-resolution of the image stack and explore how the quality of the 3D surface reconstruction can be improved.
Metrological characterization of different methods for recovering the optically sectioned image by means of structured light
We study how several methods of structured illumination microscopy affect the metrological characteristics of an areal optical profiler.
Using optical areal measurement methods to assess the surface shape and texture on aluminium anodized surfaces
We try to measure the three dimensional surface texture and shape of aluminium anodized parts with high lateral resolution.
Printing of silver conductive lines through laser-induced forward transfer
To prove the feasibility of the proposed approach for printing continuous lines free from scalloping and bulging with excellent definition.
Sensofar Papers
Sensofar R&D is constantly growing its know-how, technology and system capabilities.
These developments are illustrated by Sensofar’s continued commitment within and for the scientific optical metrology community, a proof of this is the number of technological papers that have been developed and published.
Our expertise reflected in technical and scientific publications
A collection of articles dealing with very interesting topics on surface metrology within the framework of several markets and industries.
Includes a wide range of specific 3D surface measurement solutions, or applications of optical technologies in which we are experts:
Computational self-corrected quantitative 3D topographic imaging
We have developed a self-correction algorithm capable of greatly reducing non-linearity errors in the scanning mechanism of 3D microscopy. The approach is computationally self-corrected in the [...]
Fast topographic optical imaging using encoded search focal scan
We propose a method for increasing the speed of topographic imaging by orders of magnitude.
Optimisation of imaging confocal microscopy for topography measurements of metal additive surfaces
The contribution offered by this work is an increased understanding of imaging confocal microscopy measurement of metal additive surfaces, along with the establishment of good practice guidance [...]
Single-shot optical surface profiling using extended depth of field 3D microscopy
We report the implementation of a technique able to reconstruct surface topographies at high resolution, only from the acquisition of a single camera shot, dropping the need to perform an axial [...]
Optical system for the measurement of the surface topography of additively manufactured parts
We present an optical system that features a large numerical aperture (>0.3) and a wide field of view (2.9 x 2.9) mm, capable of measuring additive manufacturing parts in a single measurement, [...]
