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Our products are designed to solve inspection requirements in the field of semiconductors, microelectronics, optics, and surface finishing. Covering the large markets of advanced manufacturing and consumer electronics.
Case studies
19 August, 2021
Yaiza Gomez, David Gutierrez, Laura Abellan and Paul Berenguer
GPAINNOVA explains to us how to quantify the quality of the polishing process and to report the roughness reduction in the samples after polishing with DLyte.
2 June, 2021
Robert Gurney and David Páez
In this case study, Linkam and Sensofar Metrology demonstrate their collaboration in producing an experimental setup for temperature-controlled optical profilometry experiments.
10 February, 2021
Lauren Zarzar, Nate Sturniolo, Caleb Meredith, and Amy Goodling
The research involves the design of microstructures that generate interference colors.
27 November, 2020
Frantisek Lofaj, Lenka Kvetkova and Margita Kabatova
The case study focuses on the development of nanocomposite W-C:H coatings with high hardness and simultaneously, with a lower coefficient of friction.
1 September, 2020
Thomas Forrer and Paco Neuhaus
The purpose of this case study is to measure the cutting-edge radius of an insert with a 3D optical profiler and also extract the roughness parameters along the edge of the cutting tool.
30 March, 2020
Zhaolong Zhang and Dr. Christopher Brown
In this study, a non-contact 3D surface metrology confocal microscopy is used for the measurement of ceramic layers to measure heights, and volumes of single-layer ceramic paths, and heights of two-layer printed ceramic parts.
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