Sensofar expands its distribution network in the USA with a new partner in the Central Region
News
Inspiring Metrology: A conversation with Lei Zheng, Researcher at Leibniz University Hannover.
We are proud to introduce an enhanced version of the S wide optical profiler. This remarkable system, designed for lightning-fast large-area measurements, now offers new functionalities to boost your characterization processes.
Inspiring Metrology: A conversation with Jackie Garofano, Chief Technology Officer at the Connecticut Center for Advanced Technology (CCAT).
Sensofar is thrilled to announce a revolutionary patent that is set to redefine the landscape of optical measurements.
We are pleased to announce our renewal collaboration with MTC for an additional three years by providing them with our innovative S wide.