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Learn all about the new Sensofar system S wide. This exceptional 3D Optical Profiler expands metrology towards a larger field of view for surface roughness measurement. The S wide integrates the benefits of a digital microscope into a hi-resolution, fast scanning measuring instrument.

KEY TOPICS

  The new Sensofar system S wide, improves routine operation through ease of use, with one-shot height measurements up to 40 mm, without Z-scanning

  Achievement of sub-micron height repeatability over entire extended area

  Color acquisition with the best resolution thanks to the integrated 5Mpx camera

  Form deviation from 3D CAD models for an effective integration to daily internal processes

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